Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Operation of NMOSFET-only Scan Driver IC for AC PDP

NMOSFET으로 구성된 AC PDP 스캔 구동 집적회로의 동작

  • Published : 2003.07.01
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Abstract

We designed and tested a new scan driver output stage. Compared to conventional CMOS structured scan driver IC′s, the new NMOSFET-only scan driver circuit can reduce the chip area and therefore, the chip cost considerably. We confirmed the circuit operation with open drain power NMOSFET IC′s by driving 2"PDP test panel. We defined critical device parameters and their optimization methods lot the best circuit performance.

Keywords

References

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  2. J.Y. Jeong, Y.-H. Jung and S.-I. Kim, 'A New NMOS Structured Scan Driver Circuit for ac PDP's' EURODISPLAY'2002, pp. 329, France, Oct. 2002
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