Abstract
This paper describes the characteristics of capacitor elements at self healing. Self healing events were forced to be created by the over-rated voltage of the capacitor elements. The self healing site was photographed by the Scanning Electron Microscope and the by-products of self healing were analyzed by the Energy Dispersive X-ray Spectrometer. Also the self healing site was analyzed by the Differential Scanning Calorimeter and the Fourier Transform Infrared Spectrometer. As a result, the main component of by-products due to the hum cut at self healing was carbon. The Fourier Transform Infrared analysis result of the self-healing specimen was similar to that of the virgin specimen, however, different from that of the specimen thermally treated at 500$^{\circ}C$. It was observed that heat flow peaks of virgin specimen were different from self-healing specimen by the Differential Scanning Calorimeter analysis.
본 논문에서는 금속증착 커패시터 소체내에서 발생하는 셀프힐링 특성을 연구 검토하였다. 커패시터에 정격전압 이상의 직류 전압으로 셀프힐링을 발생시켜 발생위치를 표정하였으며, 발생부위에 대해서는 전자주사현미경, 에너지 분산형 X선 분광기, 적외선분광기, 시차주사열량계를 사용하여, 셀프힐링 전·후 표면구조, 성분분석, 화학적 구조변화, 열적특성을 분석하였다. 실험 결과, 셀프힐링 발생시의 부산물은 주로 탄소 성분이었다. 건전시료와 셀프힐링 발생시료의 적외선 스펙트럼 분석은 유사하였으나, 500(%)에서 열처리된 시료의 적외선 스펙트럼 분석은 서로 달랐다. 시차주사열량계 분석결과 금속증착 폴리프로필렌필름의 건전시료와 셀프칠링 발생시료의 열량 피크는 서로 달랐다.
