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Single Nanoparticle Ion Trap (SNIT): A Novel Tool for Studying in-situ Dynamics of Single Nanoparticles

  • 발행 : 2003.05.20

초록

The development of high performance single nanoparticle ion trap (SNIT) apparatus for studying in-situ dynamics of single nanoparticles in controlled environments is described. The performance of SNIT apparatus has been evaluated for 500 nm SiO₂particles. The mass resolution of ~100 ppm and the capability of varying the charge states independently have been demonstrated.

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참고문헌

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피인용 문헌

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  2. Thermally Brightened CdSe/ZnS Quantum Dots as Noncontact Probes for Surface Chemistry Studies of Dark Nanoparticles Trapped in the Gas Phase vol.119, pp.26, 2015, https://doi.org/10.1021/jp5109027
  3. Single-molecule mass spectrometry vol.36, pp.6, 2016, https://doi.org/10.1002/mas.21495
  4. Improved microparticle electrodynamic ion traps for physics teaching vol.86, pp.7, 2018, https://doi.org/10.1119/1.5034344
  5. Physical Chemistry Research Articles Published in the Bulletin of the Korean Chemical Society: 2003-2007 vol.29, pp.2, 2008, https://doi.org/10.5012/bkcs.2008.29.2.450
  6. Particle dynamics in damped nonlinear quadrupole ion traps vol.83, pp.4, 2003, https://doi.org/10.1119/1.4902185
  7. Characterisation of a charged particle levitated nano-oscillator vol.53, pp.17, 2020, https://doi.org/10.1088/1361-6463/ab71a7