대한전자공학회논문지SD (Journal of the Institute of Electronics Engineers of Korea SD)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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다중 전송선에 영향을 받는 Crosstalk 잡음을 위한 테스트 생성

Test Generation for Multiple Line Affecting Crosstalk Effect

  • 이영균 (崇實大學校 컴퓨터學科) ;
  • 양선웅 (崇實大學校 컴퓨터學科) ;
  • 김문준 (崇實大學校 컴퓨터學科) ;
  • 장훈 (崇實大學校 컴퓨터學部)
  • Lee, Young-Gyun (Department of Computing, Graduate School, Soongsil University) ;
  • Yang, Sun-Woong (Department of Computing, Graduate School, Soongsil University) ;
  • Kim, Moon-Joon (Department of Computing, Graduate School, Soongsil University) ;
  • Chang, Hoon (School of Computing, Soongsil University)
  • 발행 : 2002.09.01
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⟨ 이전 논문 다음 논문 ⟩

초록

VLSI 영역에서 전송선에 발생하는 상호교차 커패시턴스(cross-coupling capacitance)가 중요한 이슈가 됨에 따라 이로 인한 고장을 검출하는 몇 가지 ATPG 알고리즘이 제안되었다. 대부분 단일한 능동선로만을 대상으로 연구가 진행되었으며, 테스트 생성 효율에 비해 많은 시간비용을 감수해야 하는 결과를 내 놓을 수 밖에 없었다. 이에 대한 대안으로 본 논문에서는 다중 선로를 대상으로 하는 잡음 모델에 관해 연구하였다. 본 논문은 다수의 전송선에 영향을 받는 crosstalk 모델을 제시하고 이 모델에 따라 crosstalk 잡음 고장 검출을 목적으로 하는 ATPG 알고리즘을 제안한다. 이 논문에서는 crosstalk에 의한 잡음 고장을 정적 해저드로 조건을 설정하고, 각 게이트에 따라 이 조건을 만족하는 진리표를 만들 것이다. 그 후 PODEM에 기반한 ATPG 알고리즘을 구현한 후 그 결과를 보인다.

As cross-coupling capacitance generated in transmission line has been an important issue in VLSI world, a couple of ATPG algorithms has been proposed. However they were studied only for a simple single-line effect problem, so it cost so much time for an unsatisfying test generation efficiency. In this paper, we studied a noise model for multiple affected lines and generated test patterns in a short time. This paper proposes a crosstalk model affected by multiple tranmission lines and implemented an ATPG algorithm for detection of crosstalk noise faults. We modeled the crosstalk noise by multiple transmission line and made a truth table for this. We implemented an ATPG algorithm based on PODEM and revealed the results.

키워드

참고문헌

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