References
- Bai, D. S. and H. J. Yun, 'Accelerated Life Tests for Products of Unequal Size', IEEE Trans. Rel., Vol. 45, No. 4, pp. 611-618, 1996 https://doi.org/10.1109/24.556583
- Nelson, W., 'Analysis of Accelerated Life Test Data-Part I : The Arrhenius Model and Graphical Methods', IEEE Trans. Rel., Vol. EI-6, No. 4, pp. 165-181, 1971
- Nelson, W., 'Analysis of Accelerated Life Test Data-Part II: Numerical Methods and Test Planning', IEEE Trans. Rel., Vol. EI-7, No. 1, pp. 36-55, 1972
- Nelson, W., 'Analysis of Accelerated Life Test Data-Part III: Product Comparisons and Checks on the Validity of the Model and Data', IEEE Trans. Rel., Vol. EI-7, No. 2, pp. 99-119, 1972
- Nelson, W., 'Accelerated Life Testing-Step-Stress Model and Data Analyses', IEEE Trans. ReI., Vol. R-29, No. 2, pp. 103-108, 1980 https://doi.org/10.1109/TR.1980.5220742
- Seo, S. K. and B. J. Yum, 'Accelerated Life Test Plans under Intermittent Inspection and Type- I Censoring: The Case of Weibull Failure Distribution', Nav. Res. Log., Vol. 38, pp. 1-22, 1991 https://doi.org/10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3
- Singpurwalla, N. D., 'Inference from Accelerated Life Tests When Observations Are Obtained from Censored Samples', Technometrics, Vol. 13, No. 1, pp. 161-170, 1971 https://doi.org/10.2307/1267083
- Singpurwalla, N. D., 'A Problem in Accelerated Life Testing', J, Amer. Statist. Assoc., Vol. 66, No. 336, pp. 841-845, 1971 https://doi.org/10.2307/2284238
- Singpurwalla, N. D., 'Inference from Accelerated Life Tests Using Arrhenius Type Re-Parameterizations', Technometrics, Vol. 15, No. 2, pp. 289-299, 1973 https://doi.org/10.2307/1266989
- Singpurwalla, N. D., V. C. Castellino, and D. Y. Goldschen, 'Inference from Accelerated Life Tests Using Eyring Type Re-Parameterizations', Nav. Res. Log. Q., Vol. 22, pp. 289-296, 1975 https://doi.org/10.1002/nav.3800220207
- Won, Y. C., 'Accelerated Life Tests under Uniform Stress Distribution', Journal of the Safety Management & Science, Vol. 2, No.2, pp.71-83, 2000
- Yin X. K. and B. J. Sheng, 'Some Aspects of Accelerated Life Testing by Progressive Stress', IEEE Trans. ReI., Vol. R-36, No. 1, pp. 150-155, 1987 https://doi.org/10.1109/TR.1987.5222320
- Yum, B. J. and S. C. Choi, 'Optimal Design of Accelerated Life Tests under Periodic Inspection', Nav. Res. Log., Vol. 36, pp. 779-795, 1989 https://doi.org/10.1002/1520-6750(198912)36:6<779::AID-NAV3220360604>3.0.CO;2-2