Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Fault Diagnosis Algorithm for Dual Port Memories

이중 포트 메모리를 위한 고장 진단 알고리듬

  • Park, Han-Won (Dept.of Electric Electronics Engineering, Yonsei University) ;
  • Gang, Seong-Ho (Dept.of Electric Electronics Engineering, Yonsei University)
  • 박한원 (연세대학교 전기전자공학과) ;
  • 강성호 (연세대학교 전기전자공학과)
  • Published : 2002.03.01
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Abstract

As dual port RAMs are widely used in the various applications, the need for an efficient algorithm to diagnose faults in dual port RAMs is increased. In this paper we propose an efficient algorithm that can diagnose all kinds of faults in dual port RAMs. In addition, the new algorithm can distinguish various fault models and locate the position related to each fault. Using the new algorithm, fault diagnosis for dual port RAMs can be performed efficiently and the performance evaluation with previous approaches proves the efficiency of the new algorithm.

현재 다양한 분야에서 이중 포트 메모리의 사용이 증가함에 따라서 이중 포트 메모리의 고장을 진단하기 위한 효율적인 고장 진단 알고리듬의 필_도성이 증대되고 있다. 따라서 본 논문에서는 이중 포트 메모리에서의 효율적인 고장 진단 알고리듬을 제시하여 이중 포트 메모리에서 발생하는 거의 모든 종류의 고장에 대한 진단을 가능하게 한다. 또한 진단 과정에서 착오를 일으키지 않고 다양한 고장 모델을 구별하며 고장과 관련된 위치를 정확하게 확인하는 것이 가능하다. 새로운 진단 알고리듬을 사용함으로서 이중 포트 메모리에서의 고장 진단과정은 효과적으로 수행될 수 있으며 이전의 다른 연구들과의 성능 평가를 통해 효율성을 확인할 수 있다.

Keywords

References

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