The Transactions of the Korean Institute of Electrical Engineers C (대한전기학회논문지:전기물성ㆍ응용부문C)

The Korean Institute of Electrical Engineers (대한전기학회)
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Lifetime-Temperature Rise Model for the Evaluation of Degradation in Electric Connections/Contacts

전기적 접속/접촉부 열화 평가를 위한 수명 온도상승 모델

  • Published : 2002.02.01
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Abstract

In this paper, 'lifetime-temperature rise model' based on the 'lifetime-resistance model' is theoretically Proposed, in order to find out the evaluation method of degradation and the residual lifetime by use of infrared image camera for electric connections/contacts. Two assumptions have been builded up for the 'lifetime-temperature rise model': one is associated with the linear relationship between the temperature ism ΔK and contact resistance, and the other the functional relationship between the temperature of electric connections/contacts and the operating time presenting in the 'lifetime-resistance model'. To prove the proposed model, experiments have been performed for various electric connections/contacts. From the experimental results, measured values were quite similar to the calculated values, which proved the above-mentioned two assumptions. Therefore, by use of 'lifetime-temperature rise model', it is possible to estimate the trend of degradation and the residual lifetime for electric connections/contacts through the temperature measurements .

Keywords

References

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