International Journal of Fuzzy Logic and Intelligent Systems

  • 제2권1호
  • /
  • Pages.89-93
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  • 2002
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  • 1598-2645(pISSN)
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  • 2093-744X(eISSN)
한국지능시스템학회 (Korean Institute of Intelligent Systems)
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Wavelet Analysis to Real-Time Fabric Defects Detection in Weaving processes

  • Kim, Sung-Shin (School of Electrical and Computer Engineering, Pusan Nation University) ;
  • Bae, Hyeon (School of Electrical and Computer Engineering, Pusan Nation University) ;
  • Jung, Jae-Ryong (School of Electrical and Computer Engineering, Pusan Nation University) ;
  • Vachtsevanos, George J. (School of Electrical and Computer Engineering, Georgi Institute of Technology)
  • 발행 : 2002.03.01
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초록

This paper introduces a vision-based on-line fabric inspection methodology of woven textile fabrics. Current procedure for determination of fabric defects in the textile industry is performed by human in the off-line stage. The advantage of the on-line inspection system is not only defect detection and identification, but also 벼ality improvement by a feedback control loop to adjust set-points. The proposed inspection system consists of hardware and software components. The hardware components consist of CCD array cameras, a frame grabber and appropriate illumination. The software routines capitalize upon vertical and horizontal scanning algorithms characteristic of a particular deflect. The signal to noise ratio (SNR) calculation based on the results of the wavelet transform is performed to measure any deflects. The defect declaration is carried out employing SNR and scanning methods. Test results from different types of defect and different style of fabric demonstrate the effectiveness of the proposed inspection system.

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참고문헌

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