대한전기학회논문지:전기물성ㆍ응용부문C (The Transactions of the Korean Institute of Electrical Engineers C)
- 제50권8호
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- Pages.414-418
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- 2001
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- 1229-246X(pISSN)
CRT의 Spot-knocking 공정에 있어서 몰리브텐 팁 전계 방출 소자 냉응극의 고장 형태 분석
Failure Mode Analysis of Mo-tip EFA Cold-Cathode in CRT Spot-knocking Process
- 주병권 (KIST 정보재료소자연구센터) ;
- 김훈 (KIST 정보재료소자연구센터) ;
- 박종원 (KIST 정보재료소자연구센터) ;
- 김남수 (충북대 전기전자 및 컴퓨터공학부) ;
- 김동호 (영남대 물리학과) ;
- 이윤희 (KIST 정보재료소자연구센터)
- Ju, Byeong-Kwon ;
- Kim, Hoon ;
- Park, Jong-Won ;
- Kim, Nam-Soo ;
- Kim, Dong-Ho ;
- Lee, Yun-Hi
- 발행 : 2001.08.01
초록
Failure modes of Mo-tip FEA were investigated in detail as a preliminary study for the application of Mo-tip FEA to the CRT electron-gun as a cold cathode. It was identified that the destruction of Mo-tip FEA was originated from reflowing of arc-current during the spot-knocking process followed by secondary arc between gate electrode and cathode substrate. In order to prevent Mo-tip FEA from destruction due to arc-current, two kinds of methods were suggested, that is one is to provide the by-pass of the reflow current and the other is to install a current limiter in the path of gate connection line.