참고문헌
- Testing semiconductor memories: Theory and Practice Van de Goor, A.J.
- IEEE Trans. Computer Aided Design v.9 no.Jun. A Realistic Fault Model and Test Algorithms for Static Random Access Memories Dekker, R.;Beenker, F.;Thijssen, L.
- IEEE Design and Test of Computers no.Mar. Using March Tests to test SRAMs Van de Goor, A.J.
- Proc. of International Test Conference Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique Meixner, A.;Banik, J.
- Proc. of International Test Conference Functional and Iddq Testing on a Static RAM Meershock, R.;Verhelst, B.;McInemey, R.;Thijssen, L.
- IEEE Journal of Solid State Circuits v.1 no.Feb. Soft-Defect Detection (SDD) Technique for a High Reliability CMOS SRAM Kuo, C.;Toms, T.;Neel, B.T.;Jelemensky, J.;Carter, E.;Smith, P.
- Proc. of International Workshop on Memory Testing A Current Testing for CMOS static RAMs Yokoyama, H.;Tamamoto, H.;Narita, Y.
- Proc. of International Workshop on Iddq Testing Data Retention Testing using Iddq in CMOS Static RAMs Trower, J.L.;Halabo, R.J.
- Proc. of VLSI Test Symposium Iddq Testing of Opens in CMOS SRAMs Champac, V.H.;Castillejos, J.;Figueras, J.
- Journal of Electronic Testing: Theory and Applications Testing of Static Random Access Memories by Monitoring Dynamic Power Supply Current Su, S.;Makki, R.Z.
- Proc. of 1998 IEEE International Workshop on IDDQ Testing COMS SRAM Functional Test with Quiescent Write Supply Current Hashizume, M.;Tamesada, T.;Koyama, T.;van de Goor, A.J.
- Transient Current Peak Detector DeBar, D.;Shah, I.
- Proc. of Asian Test Symposium Dynamic Power Supply Current Testing of CMOS SRAMs Liu, J.;Makki, R.Z.;Kayssi, A.