다층 유전체위의 다중 결합선로에 대한 유한차분법(FDTD)을 이용한 해석

A general characterization procedure based on the extraction of a 2n-port admittance matrix corresponding to n uniform coupled lines on the multi-layered substrate using the Finite-Difference Time-Domain (FDTD) technique is presented. The frequency-dependent normal mode parameters are obtained from the 2n-port admittance matrix, which in turn provides the frequency-dependent distributed inductance and capacitance matrices. To illustrate the technique, several practical coupled line structures on multi-layered substrate, including a three-line structure, have been simulated. It is shown that the FDTD based time domain characterization procedure is an excellent broadband simulation tool for the design of multiconductor coupled lines on multilayered PCBs as well as thick or thin hybrid structures.