References
- IEEE Transactions on Reliability v.33 Bayes Reliability Assessment of a 2-unit Hot Stanby Redundant System Fujii, S.;Sandoh, H.
- Microelectronics and Reliability v.24 Analysis of a 2-unit Standby System with Three Modes and Imperfect Switching Device Goel, L.R.;Gupta, R.
- Bayesian Reliability Analysis Martz, H.F.;Waller, R.A.
- Operations Research v.19 On Two-unit Standby Redundant Systems with Standby Failure Osaki, S.;Nakagawa, N.
- IEEE Transactions on Reliability v.24 Stochastic Behaviors of a Two-unit Standby Redundent Systems with Imperfect Switchover Osaki, S.;Nakagawa, N.
- Microelectronics and Reliability v.17 On a 2-unit Standby Redundent System with Imperfect Switchover Subramanian, R.;Ravichandran, N