Journal of the Korean Institute of Illuminating and Electrical Installation Engineers (조명전기설비학회논문지)

The Korean Institute of IIIuminating and Electrical Installation Engineers (한국조명전기설비학회)
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Extracting the BJT SPICE 1/f Noise Parameters Based on Emitter Area

에미터 면적에 따른 BJT의 SPICE 1/f 잡음 파라미터 추출

  • 홍현문 (정회원, 동해대학교 전기공학과) ;
  • 전병석 (정회원, 충북대학교 전기공학과) ;
  • 김주식 (정회원, 충북대학교 전기공학과)
  • Published : 2000.03.01
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Abstract

In this study, present a method for extracting the BJT 1/f noise model parameters fabricated by BICMOS process. From the geometric analysis of the Kf, we show that Kf is in inverse proportion to emitter area. And it is extracting that $K=0.8\times10_{-20}, A_f=2, \alpha=1$ values.

본 연구에서는 BICMOS 공정으로 제조된 바이폴라 프렌지스터의 SPICE 잡음 파라미터 추출방법을 제시하였다. 기하학적 분석요로부터 $K_f$ 값이 에미터 면적에 반비례하고 있음을 보였다. 그리고 $K=0.8\times10_{-20}, A_f=2, \alpha=1$ 값이 추출되었다.

Keywords

References

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  3. Proc. IEEE, 76 Unified Presentation of 1/f Noise in Electronic Device Fundamental 1/f Noise Sources A.van der Ziel
  4. IEEE Trans. Electron Devices v.ED-41 no.11 Extracting 1/f Noise Coefficients for BJT's Julio,C.Costa;Dave Ngo;Rovert Jackson;Natalino Camilleri;James Jaffee
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  6. IEEE Trans. Elec. Dev. v.ED-39 Location of Low-Frequency Noise Sources in Submicron Bipolar Transistors T.G.M.Kleinpenning