Journal of Korean Vacuum Science & Technology
- 제3권1호
- /
- Pages.30-32
- /
- 1999
- /
- 1226-6167(pISSN)
A simulation study on vertical focusing in micro-tip FED
- Lee, Chun-Gyioo (Flat Display Lab., Technology Center, Samsung Display Devices) ;
- Jo, Sung-Ho (Flat Display Lab., Technology Center, Samsung Display Devices) ;
- Ko, Tae-Young (Flat Display Lab., Technology Center, Samsung Display Devices) ;
- Moon, Soo-Young (Flat Display Lab., Technology Center, Samsung Display Devices) ;
- Yunsoo Choe (Flat Display Lab., Technology Center, Samsung Display Devices)
- 발행 : 1999.04.01
초록
Electron beam trajectory simulation results on the high voltage FED with cone-type field emitters predict that the cross-talk phenomena would be seen due to the divergence of the electron beam. In this study, computer simulations with design of experiment technique and the SNU-FEAT program were carried out for five input parameters of the aperture focusing structure. The results tell that the focusing voltage is a dominant factor. And, the beam divergence index could be reduced to 10.7