A Lateral Dual-Channel Emitter Switched Thyristor with the Segmented p-Base

세그먼트 p-베이스를 이용한 수평형 이중 채널 EST

  • Published : 1999.07.01

Abstract

A new lateral device entitled SB-DCEST(segmented p-base dual-channel emitter switched thyristor), which suppresses the snapback is proposed and successfully fabricated. The proposed device effectively suppressed the snapback phenomenon by employing the gigh resistance in self-aligned segmented p-base when compared with the conventional DCEST. The experimental results show that the SB-DCEST has the low forward voltage drop of 4.3 V at anode current of $150 A/cm^2$ with the eliminated snap-back regime, while conventional DCEST exhibits higher forward voltage drop of 5.3 V.

Keywords

References

  1. Proc. IEDM Comparison of N and P channel IGTs M. F. Chang(et al.)
  2. Proc. SSDM A New Dual-Gate LIGBT with the shorted Anode B.H. Lee;W.O. Lee;M.S. Lim;J.E. Park;M.K. Han;Y.I. Choi
  3. Proc. ISPSD Theoretical and Experimental Investigation of 500V p- and n-channel VDMOS-LIGBT Transistor V. Parthasarathy;T. P. Chow
  4. IEEE Electron Device Letters v.13 no.12 Lateral Junction-Isolated Emitter Switched Thyristor B.J. Baliga