VLSI 테스팅의 기술동향

참고문헌

1. The Nationale Technology Roadmap for Semiconductors-Technology Needs1997(Edition) Semiconductor Industry Association
2. 테스팅 및 테스티을 고려한 설계 홍성제;박은세;강성호;최호용;장훈
3. Digital Systems Testing and Testable Design M. Abramovici;M. A. Breuer;A. D. Friedman
4. Standard Test Access Port and Boundary-Scan Architecture, Document P1149.1/D5(Draft)
5. IEEE Design & Test of Computers A Tutuorial on Built-In Self-Test V. D. Agrawal;C. R. Kime;K. K. Saluja
6. Proc. ICCAD QUIETEST: A quiescent current testing methodology for detecting leakage faults W. Mao;R. Gulati;D. Goel;M. Ciletti
7. Proc. DAC Delay Test Generation E. Hsieh(et al.)
8. Testing Semiconductor Memories A. J. Van de Goor