Journal of Electrical Engineering and information Science

The Korean Institute of Electrical Engineers (대한전기학회)
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The Application of Wavelets to Measured Equation of Invariance

  • Lee, Byunfji (Kwangwoon University) ;
  • Youngki Cho (Kyungpook National University) ;
  • Lee, Jaemin (Telecommunication Development Center Information & System Business Samsung Electronics Co., Ltd.)
  • Published : 1998.06.01
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Abstract

The measured equation of invariance (MEI) method was introduced as a way to determine the electromagnetic fields scattered from discrete objects. Unlike more traditional numerical methods, MEI method over conventional methods over conventional methods are very substantial. In this work, Haar wavelets are applied to the measured equation of invariance (MEI) to solve two-dimensional scattering problem. We refer to "MEI method with wavelets" as "Wavelet MEI method". The proposed method leads to a significant saving in the CPU time compared to the MEI method that does not use wavelets as metrons. The results presented in this work promise that the Wavelet MEI method can give an accurate result quickly. We believe it is the first time that wavelets have been applied in conjunction with the MEI method to solve this scattering problem.

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References

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