Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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The Critical Characteristics Attributed to the Slow Cooling and Annealing Time in the Melting Growth

용융성장시 서냉시간과 후열처리시간에 따른 임계특성

  • 임성훈 (전북대학교 전기공학과) ;
  • 최명호 (전북대학교 전기공학과) ;
  • 강형곤 (전북대학교 전기공학과) ;
  • 정동철 (전북대학교 전기공학과) ;
  • 박종광 (전북대학교 전기공학과) ;
  • 한병성 (전북대학교 전기공학과)
  • Published : 1998.04.01
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Abstract

The influence of slow cooling and annealing time in $O_2$in MPEG process on $J_c$ was investigated. From the measurement of $J_c$,SEM and XRD, it was observed that the critical current density was related with the slow cooling time and annealing time in $O_2$. The value of $J_c$ was the highest at slow cooling time of 40 hour. And also, the value of $J_c$ along the annealing time in $O_2$in the case of the slow cooling time of 40 hours was inclined to increase with annealing time. Consequently, it can be suggested that proper slow cooling time and annealing time after slow cooling in MPMG process be important to improve the critical characteristics.

Keywords

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