Signal line potential variation analysis and modeling due to switching noise in CMOS integrated circuits

CMOS 집적회로에서 스위칭 노이즈에 의한 신호선의 전압변동 해석 및 모델링

A signal line potential variation due to the delta-I noise was physically investigated in CMOS integrated circuits. An equivalent circuit for the noise analysis was presented. The signal line was modeled as segmented RC-lumped circuits with the ground noise. Then the equivalent circuit was mathematically analyzed. Therebvy a new signal line potential variation model due to the switching mosie was developed. Th emodel was verified with 0.35.mu.m CMOS deivce model parameters. The model has an excellent agreement with HSPICE simulation. Thus the proposed model can be dirctly employed in the industry to design the high-performance integrted circuit design as well as integrated circuit package design.