Maximum Likelihood Estimation of Lifetime Distribution under Stress Bounded Ramp Tests: The Case Where Stress Loaded from Use Condition

스트레스 한계가 있는 램프시험하에서 신뢰수명분포의 최우추정: 사용조건에서부터 스트레스를 가하는 경우

This paper considers maximum likelihood (ML) estimation of lifetime distribution under stress bounded ramp tests in which the stress is increased linearly from used condition stress to the stress u, pp.r bound. The following assumptions are used: exponential lifetime distribution under a constant stress, an inverse power law relationship between stress and mean of exponential lifetime distribution, and a cumulative exposure model for the effect of changing stress. Likelihood equations for the parameters involved in the model and asymptotic distribution of the estimators are obtained, and a numerical example is given.