Journal of Institute of Control, Robotics and Systems (제어로봇시스템학회논문지)

Institute of Control, Robotics and Systems (제어로봇시스템학회)
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A variably compliable probe system for the in-circuit test of a PCB

인쇄회로기판의 통전검사를 위한 가변순응력을 갖는 프로브 시스템

  • Shim, Jae-Hong (Automatic research Center, Production Technology Center, Samsung Electronics Corporation) ;
  • Cho, Hyung-Suck (Korea Advanced Institute of Science and Technology) ;
  • Kim, Sung-Kwun (Samsung Electronics Corporation)
  • 심재홍 (삼성전자 생산기술센타 자동화연구소) ;
  • 조형석 (한국과학기술원) ;
  • 김성권 (삼성전자 생산기술센타)
  • Published : 1997.06.01
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Abstract

A new probing mechanism and an active compliance control algorithm have been developed for the in-circuit test of a PCB( printed circuit board ). Commercially available robotic probing devices are incapable of controlling contact force generated through rigid probe contacts with a solder joint, at high speed. The uncontrollable excessive contact force often brungs about some defects on the surface of the solder joint, which is plastically deformable over some limited contact force. This force also makes unstable contact motions resulting in unreliable test data. To overcome these problems, we propose that a serially connected macro and micro device with active compliance provide the best potential for a safe and reliable in-circuit test. This paper describes the design characteristics, modeling and control scheme of the newly proposed device. The experimental results clearly show the effectiveness of the proposed system.

Keywords

References

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