Journal of the Korean Institute of Telematics and Electronics C (전자공학회논문지C)
- Volume 34C Issue 1
- /
- Pages.1-11
- /
- 1997
- /
- 1226-5853(pISSN)
Test Pattern Genration for Detection of Stuck-Open and Stuck-On Faults in BiCMOS Circuits
BiCMOS 회로의Stuck-Open 고장과 Stuck-On 고장 검출을 위한 테스트 패턴 생성
Abstract
A BiCMOS circuit consists of the CMOS part which performs the logic function, and the bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential beavior. Also, stuck-on faults enhanced IDDQ (quiscent power supply current) at steady state. In this paper, a method is proposed which efficiently generates test patterns to detect stuck-open faults and stuck-on faults in BiCMOS circuits. The proposed method divides the BiCMOS circuit into pull-up part and pull-down part, and generates test patterns detect faults occured in each part by structural property of the BiCMOS circuit.
Keywords