Optimum Design of Accelerated Degradation Tests for Weibull Distribution

와이블성능분포인 경우 가속퇴화시험의 최적설계

For highly reliable devices it is often defined to "fail" when its performance degrades below a specified value. In this paper we consider a method for optimally designing accelerated degradation tests(ADTs) in which the performance over exposure time and stress has Weibull distribution. For the product whose performance has Weibull distribution, the optimum plan - low stress level and sample proportions allocated to each test condition - is obtained, which minimize the asymptotic variance of maximum likelihood estimator of a stated quantile at design stress. We also present compromise ADTs plan that can be used for the practical purpose.