Journal of the Korean Institute of Telematics and Electronics A (전자공학회논문지A)
- Volume 32A Issue 3
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- Pages.100-109
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- 1995
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- 1016-135X(pISSN)
Tail Electron Hydrodynamic Model for Consisten Modeling of Impact Ionization and Injection into Gate Oxide by Hot Electrons
고온전자의 충돌 이온화 및 게이트 산화막 주입 모델링을 위한 Tail 전자 Hydrodynamic 모델
Abstract
A new Hydrodynamic model for the high energy tail electrons(Tail Electron Hydrodynamic Model : TEHD) is developed using the moment method. The Monte Carlo method is applied to a
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