Journal of the Korean Institute of Telematics and Electronics A (전자공학회논문지A)
- Volume 30A Issue 12
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- Pages.88-97
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- 1993
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- 1016-135X(pISSN)
Reliability Analysis of CMOS Circuits on Electorstatic Discharge
CMOS 회로의 ESD에대한 신뢰성 문제 및 보호대책
Abstract
Electrostatic Discharge(ESD) is one of the major reliability, issues for today's VLSI production. Since the gate oxide with a thickness of 100~300
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