Journal of the Korean Institute of Telematics and Electronics A (전자공학회논문지A)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Study on Sheet Resistance and Temperature Stability of $RuO_2$-based Thick Film Resistors with Varying Glass Composition

$RuO_2$를 기본으로 한 후막 저항체의 유리질 성분에 따른 저항값과 온도 안정성에 관한 연구

  • Choi, Dong-Wook (Dept. of Elec. Eng., Sogang Univ.) ;
  • Kim, Jun-Chul (Dept. of Elec. Eng., Sogang Univ.) ;
  • Kim, Geun-Young (Dept. of Elec. Eng., Sogang Univ.) ;
  • An, Chul (Dept. of Elec. Eng., Sogang Univ.)
  • 최동욱 (서강대학교 전자공학과) ;
  • 김준철 (서강대학교 전자공학과) ;
  • 김근영 (서강대학교 전자공학과) ;
  • 안철 (서강대학교 전자공학과)
  • Published : 1992.11.01
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Abstract

The dependence of electrical characteristics of RuO$_2$-based thick film resistors on the RuO$_2$ contents, glass composition variation and the firing temperatures was measured. The sheet resistance of resistors decreased as the contents of RuO$_2$ increased and at firing temperatures higher than C, the sheet resistance increased as the firing temperature increased. In case of using lead borosilicate glass-containing $Bi_{2}O_{3}$, the sheet resistance decreased as the contents of $Bi_{2}O_{3}$ increased. TCR changes from negative to positive values as RuO$_2$ contents increased and from positive to negative values as the firing temperature increased. TCR increased to positive values as $Bi_{2}O_{3}$ increased in the glass.

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