대한전자공학회논문지 (Journal of the Korean Institute of Telematics and Electronics)
- 제24권3호
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- Pages.535-540
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- 1987
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- 1016-135X(pISSN)
고장검출이 용이한 Built-In Test 방식의 설계
Testable Design on the Built In Test Method
초록
This paper proposes a circuit partitioning method and a multifunctional BILBO which can perform the multimodule test in the case of testing VLSI circuits. By using these circuit partitioning method and multifunctional BILBO, test time and cost can be reduced greatly by performing the pipeline test method. And the quantity of circuit that shold be added for testing is also reduced in half by interposing only one BILBO between each module. Also, we confirmed that the multifunctional BILBO proposed here has high error detection capability by analyzing error detection capability of this multifunctional BILBO in mathematics.
키워드