Emission wavelength tuning of porous silicon with ultra-thin ZnO capping layers by plasma-assited molecular beam epitaxy

다공성 실리콘 기판위에 Plasma-assisted molecular beam epitaxy으로 성장한 산화아연 초박막 보호막의 발광파장 조절 연구

  • 김소아람 (인제대학교 나노메뉴팩쳐링연구소 나노시스템공학과) ;
  • 김민수 (인제대학교 나노메뉴팩쳐링연구소 나노시스템공학과) ;
  • 남기웅 (인제대학교 나노공학부) ;
  • 박형길 (인제대학교 나노공학부) ;
  • 윤현식 (인제대학교 나노공학부) ;
  • 임재영 (인제대학교 나노메뉴팩쳐링연구소 나노시스템공학과)
  • Published : 2012.05.31

Abstract

Porous silicon (PS) was prepared by electrochemical anodization. Ultra-thin zinc oxide (ZnO) capping layers were deposited on the PS by plasma-assisted molecular beam epitaxy (PA-MBE). The effects of the ZnO capping layers on the properties of the as-prepared PS were investigated using scanning electron microscopy (SEM) and photoluminescence (PL). The as-prepared PS has circular pores over the entire surface. Its structure is similar to a sponge where the quantum confinement effect (QCE) plays a fundamental role. It was found that the dominant red emission of the porous silicon was tuned to white light emission by simple deposition of the ultra-thin ZnO capping layers. Specifically, the intensity of white light emission was observed to be enhanced by increasing the growth time from 1 to 3 min.

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