THz Characterization of Ferroelectric BSTO Thin Film by THz Time-Domain Spectroscopy

Kang, Seung-Beom (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Kwak, Min-Hwan (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Kang, Dae-Won (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Kim, Sung-Il (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Jeong, Se-Young (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Ryu, Han-Cheol (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Chung, Dong-Chul (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Choi, Sang-Kuk (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Paek, Mun-Cheol (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
Kang, Kwang-Yong (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute)