Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2009.08a
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- Pages.250-250
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- 2009
THz Characterization of Ferroelectric BSTO Thin Film by THz Time-Domain Spectroscopy
- Kang, Seung-Beom (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Kwak, Min-Hwan (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Kang, Dae-Won (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Kim, Sung-Il (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Jeong, Se-Young (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Ryu, Han-Cheol (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Chung, Dong-Chul (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Choi, Sang-Kuk (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Paek, Mun-Cheol (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute) ;
- Kang, Kwang-Yong (THz device Research Team, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute)
- Published : 2009.08.19
Abstract
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