한국정보디스플레이학회:학술대회논문집
- 2009.10a
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- Pages.1531-1534
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- 2009
Investigations of process factors in the sensitivity of embedded digital switching TSP
- Han, Sang-Youn (LCD R&D Center, Samsung Electronics) ;
- Oh, Keun-Chan (LCD Division, Samsung Electronics) ;
- Seong, Dong-Gi (LCD Division, Samsung Electronics) ;
- Ham, Yeon-Sik (LCD Division, Samsung Electronics) ;
- Lyu, Jae-Jin (LCD Division, Samsung Electronics) ;
- Cho, Young-Je (LCD Division, Samsung Electronics)
- Published : 2009.10.12
Abstract
Effect of process factors on the sensitivity of inner-type digital switching TSP was analyzed. From these results, we have successfully fabricated inner-type digital switching TSP embedded in 3.2-inch WQVGA PLS mode LCD panel. During many factors, TFT sensor structure for reducing the PI thickness and a separation distance of