The effect of surface on electrical properties of OTFTs using $HfO_2$ film as the gate insulator

  • Kim, K.J. (School of information and Communication engineering, Sungkyunkwan University) ;
  • Jeong, S.W. (School of information and Communication engineering, Sungkyunkwan University) ;
  • Roh, Yong-Han (School of information and Communication engineering, Sungkyunkwan University)
  • Published : 2008.08.20