Roughening Exponent of Domain Interface in CoFe/Pt Multilayers with Varying the Number of Bilayers

  • Lee, Kang-Soo (Department of Physics and Astronomy, Seoul National University) ;
  • Lee, Chang-Won (Samsung Advanced Institute of Technology) ;
  • Cho, Young-Jin (Samsung Advanced Institute of Technology) ;
  • Seo, Sun-Ae (Samsung Advanced Institute of Technology) ;
  • Choe, Sug-Bong (Department of Physics and Astronomy, Seoul National University)
  • Published : 2008.12.10