Effects of growth temperature and post-annealing on Pr$_{0.7}$Ca$_{0.3}$MnO$_3$ film with SrRuO$_3$ buffer layer for ReRAM applications

  • Joo, Sang-Hyun (Department of Nano Science & Technology, University of Seoul) ;
  • Hong, Wan-Shick (Department of Nano Science & Technology, University of Seoul) ;
  • Park, Kyoung-Wan (Department of Nano Science & Technology, University of Seoul) ;
  • Sok, Jung-Hyun (Department of Nano Science & Technology, University of Seoul)
  • Published : 2008.02.14