Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2008.02a
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- Pages.277-277
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- 2008
Evaluation of ultra low dielectric constant SiOC(-H) thin films for advanced interconnects
- Navamathavan, R. (Nano thin Film Materials Laboratory, Department of Physics, Cheju National University) ;
- Kim, Chang-Young (Nano thin Film Materials Laboratory, Department of Physics, Cheju National University) ;
- Jung, An-Soo (Nano thin Film Materials Laboratory, Department of Physics, Cheju National University) ;
- Lee, Heon-Ju (Department of Mechanical, Energy and Production Engineering, Cheju National University) ;
- Choi, Chi-Kyu (Nano thin Film Materials Laboratory, Department of Physics, Cheju National University)
- Published : 2008.02.14
Abstract
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