불량소자의 검지를 위한 실시간 전송 뉴로 모률라

A Neural Network Modulars for Real-time Detection of Bad Materials

  • 김종만 (전남도립대학 컴퓨터응용전기과) ;
  • 김원섭 (전남도립대학 컴퓨터응용전기과)
  • 발행 : 2008.04.17

초록

A new modular Lateral Information Propagation Networks can be implemented in a IC chip with the circuit VLSI technology for detection of bad materials. The proposed modular architecture is propagated the neural network through inter module connections. For such inter module connections, the host(computer or logic) mediates the exchange of information among modules. Also border nodes in each module have capacitors for temporarily retaining the information from outer modules. For detecting of Faulty Insulator, $4\;{\times}\;4$ neural network modules has been designed and simulation of interpolation with the designed networks has been done.

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