Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지

Holographic Grating Formation of Amorphous AsSeS Thin Film

비정질 AsSeS 박막의 홀로그래픽 데이터 격자형성

  • Ju, Long-Yun (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Lee, Song-Hee (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Nam, Ki-Hyun (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Koo, Sang-Mo (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Chung, Hong-Bay (Dept. of Electronic Materials Eng. Kwangwoon Univ.)
  • 구용운 (광운대학교 전자재료공학과) ;
  • 이송희 (광운대학교 전자재료공학과) ;
  • 남기현 (광운대학교 전자재료공학과) ;
  • 구상모 (광운대학교 전자재료공학과) ;
  • 정홍배 (광운대학교 전자재료공학과)
  • Published : 2008.06.19
Download PDF
⟨ Previous Next ⟩

Abstract

In this paper, we investigated the diffraction grating efficiency on AsSeS and Ag-doped amorphous chalcogenide Ag/AsSeS thin film for used to volume hologram. The film thickness was 0.5um and diffraction efficiency was obtained from (P:P) polarized He-Ne (632.8nm)laser beam on AsSeS and Ag/AsSeS thin films. As a results, diffraction grating was not formed at AsSeS thin film but at Ag-doped AsSeS thin film, diffraction grating was formed well compare with the former.

Keywords