Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Holographic Grating Formation of AsSeS Thin Films with the Incident Beam Wavelength

서로 다른 빔에 의한 AsSeS 박막의 홀로그래픽 데이터 격자형성

  • Kim, Jae-Hoon (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Shin, Ki-Jun (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Kim, Hyun-Koo (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Koo, Sang-Mo (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Chung, Hong-Bay (Dept. of Electronic Materials Eng. Kwangwoon Univ.)
  • 김재훈 (광운대학교 전자재료공학과) ;
  • 신기준 (광운대학교 전자재료공학과) ;
  • 김현구 (광운대학교 전자재료공학과) ;
  • 구상모 (광운대학교 전자재료공학과) ;
  • 정홍배 (광운대학교 전자재료공학과)
  • Published : 2008.06.19
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Abstract

In this paper, we investigated the diffraction grating efficiency on Ag-doped amorphous chalcogenide Ag/AsSeS thin film for used to volume hologram. The film thickness was 2 um and diffraction efficiency was obtained from He-Ne (632.8nm) and DPSS(532nm) (P:P) polarized laser beam on Ag/AsSeS thin films. As a result, for the films, the maximum grating diffraction efficiency using He-Ne laser(632nm) is 0.15%[2000sec]. And then The recording speed of DPSS laser was about 40s which of batter than He-Ne lasers.

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