한국정보디스플레이학회:학술대회논문집
- 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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- Pages.1022-1025
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- 2008
OLED degradation mechanism study using impedance spectroscopy
- Kim, Hyun-Jong (Dept. of EECS, Seoul National University) ;
- Yang, Ji-Hoon (Dept. of EECS, Seoul National University) ;
- Ye, Seok-Min (Dept. of EECS, Seoul National University) ;
- Jeong, Jae-Wook (Dept. of EECS, Seoul National University) ;
- Chang, Seung-Wook (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
- Boris, Crystal (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
- Chung, Ho-Kyoon (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
- Lee, Chang-Hee (Dept. of EECS, Seoul National University) ;
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Hong, Yong-Taek
(Dept. of EECS, Seoul National University)
- 발행 : 2008.10.13
초록
To the best of our knowledge, for the first time, we applied impedance spectroscopy to analysis on OLED degradation mechanism by monitoring impedance change during constant voltage aging, and modeling OLED with lumped circuit elements. Change in each element value was used to explain charge accumulation and field redistribution in each organic layer.