CMOS 공정으로 구현한 고 전력 LIGBT 소자의 전기적 특성

Electrical Characteristics of High-Power LIGBT Devices Implemented by CMOS Process

  • 이주욱 (한국전자통신연구원 IT 융합부품 연구소) ;
  • 박훈수 (위덕대학교 반도체전자공학부) ;
  • 구진근 (한국전자통신연구원 IT 융합부품 연구소) ;
  • 강진영 (한국전자통신연구원 IT 융합부품 연구소)
  • 발행 : 2007.06.21

초록

The electrical characteristics of high power LIGBT implemented by CMOS process are described and compared with those of high voltage LDMOSFET with the same device dimensions. LIGBT has exhibited approximately 8 times superior current drive capability than LDMOSFET. The proposed p+/n+ anode structure resulted in the significant increase of on-state breakdown voltage of LIGBT. Therefore, LIGBT suggested in this paper is one of the promising candidate for smart power IC applications.

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