한국정보디스플레이학회:학술대회논문집
- 2007.08b
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- Pages.1108-1111
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- 2007
Frequency Dependence of OLED Voltage Shift Degradation
- Kim, Hyun-Jong (Dept. of EECS, Seoul National University) ;
- Kim, Su-Hwan (Dept. of EECS, Seoul National University) ;
- Chang, Seung-Wook (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
- Lee, Dong-Kyu (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
- Jeong, Dong-Seob (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
- Chung, Ho-Kyoon (Corporate R&D Center, Display Lab, Samsung SDI Co., Ltd.) ;
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Hong, Yong-Taek
(Dept. of EECS, Seoul National University)
- Published : 2007.08.27
Abstract
OLED driving voltage shift can reduce the OLED display lifetime, especially for digitally driven AMOLED. By operating OLED at high frequency, we were able to suppress OLED voltage shift degradation, expecting improved AMOLED lifetime. We describe frequency dependence of voltage shift obtained from bias stress test of OLED.