X-ray Reflection Mirror of the Periodic Multilayer Structure

주기적인 구조를 갖는 X-선 반사경 설계

  • 권택용 (단국대학교 전자물리학과 포토닉스연구실) ;
  • 정진우 (단국대학교 전자물리학과 포토닉스연구실) ;
  • 신진욱 (단국대학교 전자물리학과 포토닉스연구실) ;
  • 최재호 (단국대학교 전자물리학과 포토닉스연구실)
  • Published : 2007.07.01

Abstract

The periodic multilayer is considered as the X-ray reflection mirror. High X-ray reflectivity from the incident angle greater than the grazing critical angle can be obtained by the periodic multilayer structure. The Optical constants are investigated in order to determine the material for X-ray reflection mirror. The X-ray reflection mirror is designed for W, Si using computer simulation. The reflectivity is calculated for various incident angles and ratio of thickness.

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