대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2006년도 하계종합학술대회
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- Pages.593-594
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- 2006
Reduction of Breakdown Voltage in I-MOS Devices
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Choi, Woo-Young
(Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Song, Jae-Young (Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Kim, Jong-Pil (Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University) ;
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Kim, Sang-Wan
(Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University) ;
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Lee, Jong-Duk
(Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University) ;
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Park, Byung-Gook
(Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University)
- 발행 : 2006.06.21