Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Analysis of Cuoff Frequency and Maximum Oscillation Frequency Characteristics for $0.13{\mu}m$ CMOSFET

$0.13{\mu}m$ CMOSFET의 차단주파수 및 최대진동주파수 특성 분석

  • Kim, Jong-HyucK (Department of Electronic Engineering, Hankuk university of Foreign Studies) ;
  • Lee, Seong-Hearn (Department of Electronic Engineering, Hankuk university of Foreign Studies) ;
  • Kim, Young-Wug (Dongbu Electronics)
  • 김종혁 (한국외국어대학교 전자정보공학부) ;
  • 이성현 (한국외국어대학교 전자정보공학부) ;
  • 김영욱 (동부일렉트로닉스)
  • Published : 2006.06.21
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Abstract

The dependence of cutoff frequency and maximum oscillation frequency of $0.13{\mu}m$ CMOS transistors on layout parameters such as the unit gate width and gate finger number is measured and analyzed in this paper. This information will be very useful for high performance RF IC design.

Keywords