한국정보디스플레이학회:학술대회논문집
- 2006.08a
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- Pages.1775-1778
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- 2006
Extreme baking effect of interlayer on PLED's performance
- Kim, Mu-Gyeom (Samsung Advanced Institute of Technology) ;
- Kim, Sang-Yeol (Samsung Advanced Institute of Technology) ;
- Lee, Tae-Woo (Samsung Advanced Institute of Technology) ;
- Park, Sang-Hun (Samsung Advanced Institute of Technology) ;
- Park, Jong-Jin (Samsung Advanced Institute of Technology) ;
- Pu, Lyong-Sun (Samsung Advanced Institute of Technology)
- Published : 2006.08.22
Abstract
Through baking process on an interlayer, known as hole transporting layer, varying baking temperature up to 300 degree, which is considered as extremely high for polymer light emitting device (PLED) system, we found interesting relationship between packing density and morphology affecting device performance. Granular morphology shows that as temperature increases, grain size is getting smaller to pack closely and make interlayer harden. Such denser interlayer has temperature dependency of its own mobility, even without clear evidence of degradation of material itself. Its fact proven in a single film also reflects on multilayered PLED's performance like IVL, efficiency, lifetime. It's found that, especially, to enhance lifetime is related with thermal stability of interlayer and its mobility dependency to meet better charge balance. Therefore, it gives us understanding not only baking effect of interlayer, but also material & device designing guide to enhance lifetime.
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