한국정보디스플레이학회:학술대회논문집
- 2006.08a
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- Pages.1451-1454
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- 2006
New electrical test method for LCD cell manufacturing process
- Miyake, Yasuhiro (Agilent Technologies International Japan, Ltd.) ;
- Chikamatsu, Kiyoshi (Agilent Technologies International Japan, Ltd.) ;
- Goto, Masaharu (Agilent Technologies International Japan, Ltd.) ;
- Mizoguchi, Junichi (Agilent Technologies International Japan, Ltd.)
- Published : 2006.08.22
Abstract
We propose a new electrical test method bringing repeatable and unambiguous test results eliminating drawbacks of the lighting test for LCD Cell manufacturing process. In this paper, we will show its basic concept, examples of actual test results and effectiveness of the method.
Keywords