The study of the relationships between the MgO crystal orientation and the conditions of deposition on AC-PDP

AC PDP의 MgO 결정방향성과 증착조건간의 상관관계에 관한 연구

  • Jang, Yong-Min (Department of Electrical Engineering, Pusan National University) ;
  • Heo, Jeong-Eun (Department of Electrical Engineering, Pusan National University) ;
  • Kim, Duk-Won (Department of Electrical Engineering, Pusan National University) ;
  • Shin, Joong-Hong (Department of Electrical Engineering, Dong-Eui University) ;
  • Park, Chung-Hoo (Department of Electrical Engineering, Pusan National University)
  • Published : 2006.07.12

Abstract

There arc several important issues in AC PDP researches such as cost reduction, reliability, and good image quality. The properties of MgO layer is thought to be one of the most important (actors that affects the panel reliability through the firing voltage variation. The MgO thin film mainly has (111), (200) and (220) crystal orientation. It is reported that (111)-oriented film helps decreasing the discharge voltage, and (200)-oriented film improves the misfiring on high temperature and the image sticking. In this study, we investigated the relations between the crystal orientation and e-beam evaporation process parameters such asdeposition rate, temperature of substrate, and distance between the target(MgO tablet) and the substrate.

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