Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2005.11a
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- Pages.901-904
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- 2005
Specification-based Current Test for Mixed-signal Circuits and Optimal Test Point Selection
혼합신호 회로를 위한 Specification 기반의 전류 테스트와 최적의 테스트 포인트 선택
- Jang, Sang-Hoon (Dept. of Electronics Engineering, Kwandong University) ;
- Lee, Jae-Min (Dept. of Electronics Engineering, Kwandong University)
- Published : 2005.11.26
Abstract
Testing of mixed-signal circuit has become a difficult task for test engineers and efficient test solution to these problems are needed. In this paper a new specification-based mixed-signal test method called TSS(Time Slot Specification) using high performance current sensors and a novel test point selection technique without heavy computational overhead are proposed. External output and power nodes are used for test points and accessed by the current sensors in the ATE.
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