대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2005년도 추계종합학술대회
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- Pages.217-220
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- 2005
국소 최적 검정 통계량을 쓴 순차 검파 기법의 문턱값 분석
Threshold Analysis of a Sequential Detection Scheme with Locally Optimum Test Statistic
- 최상원 (한국과학기술원 전자전산학과) ;
- 이주미 (한국과학기술원 전자전산학과) ;
- 권형문 (한국과학기술원 전자전산학과) ;
- 박소령 (가톨릭대학교 정보통신전자공학부) ;
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송익호
(한국과학기술원 전자전산학과)
- Choi, Sang-Won (Department of Electrical Engineering and Computer Science Korea Advanced Institute of Science and Technology (KAIST)) ;
- Lee, Ju-Mi (Department of Electrical Engineering and Computer Science Korea Advanced Institute of Science and Technology (KAIST)) ;
- Kwon, Hyoung-Moon (Department of Electrical Engineering and Computer Science Korea Advanced Institute of Science and Technology (KAIST)) ;
- Park, So-Ryoung (School of Information, Communications, and Electronics Engineering, Catholic University of Korea) ;
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Song, Iick-Ho
(Department of Electrical Engineering and Computer Science Korea Advanced Institute of Science and Technology (KAIST))
- 발행 : 2005.11.26