Effects of Peripheral Pentacene Region on C-V Characteristics of Metal-Oxide-Pentacene Capacitor Structure

  • Jung, Keum-Dong (School of Electrical Engineering and Computer Sciences, Seoul National University) ;
  • Jin, Sung-Hun (School of Electrical Engineering and Computer Sciences, Seoul National University) ;
  • Park, Chang-Bum (School of Electrical Engineering and Computer Sciences, Seoul National University) ;
  • Shin, Hyung-Cheol (School of Electrical Engineering and Computer Sciences, Seoul National University) ;
  • Park, Byung-Gook (School of Electrical Engineering and Computer Sciences, Seoul National University) ;
  • Lee, Jong-Duk (School of Electrical Engineering and Computer Sciences, Seoul National University)
  • Published : 2005.07.19

Abstract

Peripheral pentacene region gives a significant influence on C-V characteristics of metal-oxide-pentacene capacitor structure. When the gate voltage goes toward negative, the effect of peripheral pentacene region becomes larger. Remaining gate DC bias constant and changing small signal frequency, the capacitance of peripheral pentacene changes along with frequency so that the total capacitance value also changes. The influence of peripheral pentacene region should be removed to measure accurate C-V characteristics, because it is hard to take into account the effect of the region quantitatively. After removing the influence of peripheral pentacene region, acceptor concentration, flat band voltage and depletion width of pentacene thin film are extracted from an accurate C-V curve as $1.58{\times}10^{17}cm^{-3}$, -1.54 V and 39.4 nm, respectively.

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